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Enhanced UVB Photoluminescence Intensity of Calcium Phosphate Co-doped with Gadolinium and Praseodymium for Phototherapy Applications
Published in Odireleng Martin Ntwaeaborwa, Luminescent Nanomaterials, 2022
X-ray diffraction (XRD) analysis was carried out using a Bruker AXS D8 ADVANCE X-ray diffractometer with Cu K±1 radiation (l = 1.5406 Å) in the range of 10°-60°. X-ray photoelectron spectroscopy (XPS) analyses were performed using a PHI 5000 Versaprobe system to examine the chemical states of the elements in the Ca5(PO4)3OH:Gd3+, Pr3+ powder phosphor. The particle morphology was analysed using a JEOL JSM 7800F thermal field emission scanning electron microscope (FE-SEM) and a Jeol JEM-ARM200F high resolution transmission electron microscope (HRTEM). The chemical composition was carried out using an Oxford Instruments AzTEC energy dispersive spectrometer (EDS), with X-Max80 silicon drift detector (SDD) system, attached to the FESEM. The absorption, and subsequently the bandgap energy, was evaluated using a Perkin Elmer Lambda 950 UV-vis spectrometer. The photoluminescence (PL) data were recorded using a Varian Cary Eclipse fluorescence spectrophotometer coupled with a monochromatized 150 W xenon lamp used as an excitation source.
Silicon Radiation Sensors
Published in Cinzia Da Vià, Gian-Franco Dalla Betta, Sherwood Parker, Radiation Sensors with Three-Dimensional Electrodes, 2019
Cinzia Da Vià, Gian-Franco Dalla Betta, Sherwood Parker
The silicon drift detector (SDD), also called the semiconductor drift chamber, was first proposed by Gatti and Rehak in 1984 [16, 17]. It is a device made on high-resistivity n-type silicon wafers with rectifying p-n junctions implanted on both sides. The detector is fully depleted of mobile charges by applying a suitable reverse voltage to the p-n junctions on both sides of the wafer. An electrostatic potential parallel to the surface is then superimposed onto the depleting vertical potential by means of resistive voltage dividers. A schematic view of a drift detector is reported in Fig. 2.11, showing the basic operation mechanism: While holes are swept away by the p+ electrodes close to the point of interaction, electrons generated inside the volume of the detector are drifted along the bottom of the potential valley toward one small collecting anode, where they finally induce a signal.
Detection Technology
Published in Rick Houghton, William Bennett, Emergency Characterization of Unknown Materials, 2020
Rick Houghton, William Bennett
Lighter elements are more difficult to fluoresce and detect. Identification of atomic number 12, magnesium through atomic number 16, sulfur, is possible with the use of a silicon drift detector (SSD). SSD is a solid-state detector that enables high count rate and high resolution while geometrically positioned to maximize efficiency. The Niton XL5 uses SSD with a more powerful x-ray source to reliably identify these lighter elements in the field.
Superhydrophobic SLA 3D printed materials modified with nanoparticles biomimicking the hierarchical structure of a rice leaf
Published in Science and Technology of Advanced Materials, 2022
Belén Barraza, Felipe Olate-Moya, Gino Montecinos, Jaime H. Ortega, Andreas Rosenkranz, Aldo Tamburrino, Humberto Palza
X-ray diffraction spectroscopy (×RD) spectra of the modified nanoparticles were obtained using a Bragg-Brentano powder X-Ray Diffractometer (model D8 Advance, Bruker), having a linear LynxEye detector (40 kV/30mA). Transmission electron microscopy (TEM) images of the nanoparticles were acquired from a Hitachi HT7700 microscope (120 kV). The thermogravimetric analysis (TGA) was performed between 28°C and 700°C at 10 °C/min under a nitrogen atmosphere in a NETZSCH TG 209 F1 Libra® instrument (Germany). Surface modification of the TiO2 nanoparticles was studied through attenuated total reflection Fourier-transform infrared spectroscopy (ATR-FTIR). ATR-FTIR spectra were acquired from a Thermo Scientific Nicolet iS 10 spectrophotometer coupled to an ATR Smart iTX accessory with a monolithic diamond crystal. The surface topography was observed using a field emission scanning electron microscope (FE-SEM). FE-SEM images were acquired with an FEI QuantaTM 250 microscope equipped with an Octane silicon drift detector for elemental analysis via energy-dispersive X-ray spectroscopy (EDS).
Design and characterization of ceramic hollow fiber membrane derived from waste ash using phase inversion-based extrusion/sintering technique for water filtration
Published in Journal of Asian Ceramic Societies, 2021
Zhong Sheng Tai, Mohd Hafiz Dzarfan Othman, Azeman Mustafa, Mohd Irfan Hatim Mohamed Dzahir, Siti Khadijah Hubadillah, Khong Nee Koo, Mohd Ariff Azali, Nur Hashimah Alias, Boon Seng Ooi, Tonni Agustiono Kurniawan, Ahmad Fauzi Ismail
where F is the force at which the hollow fiber membrane fractured (N), L is the length of the membrane (m), whereas Do and Di are the outer and inner diameters of the membrane (m), respectively. The elemental composition of the glassy structure of the outer surface of the CHFM was determined through energy-dispersive X-ray spectroscopy (EDX) using a Hitachi Silicon Drift Detector under the observation of SEM. The surface roughness of the CHFM prepared at different sintering temperatures was investigated via the atomic force microscopy (AFM) analysis using a XE-100 AFM from Park Systems by tip-scanning with a scan size of 10 μm × 10 μm. A Micromeritics Autopore IV 9510 mercury porosimeter was used to characterize the pore size distribution (PSD), porosity, and tortuosity factor of the membranes sintered at different temperatures (1 025 °C–1 100°C). The pure water flux (PWF) performance of the membranes was tested using a homemade crossflow filtration system. The flux performance test was conducted at a pressure of 2 bar at room temperature for one hour. The test was repeated three times (n = 3) for each sample. Before starting the experiment, the membranes were stabilized by running the pure water through the membranes at a constant pressure for 10 minutes. PWF (L/m2h) was calculated using the following equation.
Experimental study on transport behavior of cesium iodide in the reactor coolant system under LWR severe accident conditions
Published in Journal of Nuclear Science and Technology, 2020
Naoya Miyahara, Shuhei Miwa, Mélany Gouëllo, Junpei Imoto, Naoki Horiguchi, Isamu Sato, Masahiko Osaka
The sampling coupons were examined with a JSM-IT100 (JEOL) Scanning Electron Microscope (SEM) equipped with an Energy Dispersive X-ray Spectroscopy (EDS) silicon drift detector. The voltage of the electron beam was set to 15 keV. X-ray Diffraction (XRD) analysis and Raman spectroscopy were also applied to evaluate the chemical forms of the deposits. The XRD analysis was performed with a Miniflex600 (Rigaku) at room temperature using a Cu-Kα spectrum over the 2Ɵ range from 3 to 80 degrees with a step size of 0.1 degrees and the scanning speed of 1 degree/min. The applied voltage and current were 30 kV and 15 mA, respectively. The Raman spectroscopy was performed with an NRS-3100 (JASCO) Raman micro-spectrometer which features a high performance 532 nm laser, thermoelectrically cooled Charge-Coupled Device (CCD) detector and an 1800 grooves/mm holographic grating. The spectral range in this study was from 100 to 4000 cm−1.