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Introduction to Computer Based Manufacturing Systems
Published in John Gaylord, Factory Information Systems, 2020
Computer aided test (CAT) systems use automatic test equipment (ATE) to do in-process, final, and quality assurance testing. The ATE systems use a computer to execute the test program. This software program sequentially applies a series of appropriate ambient conditions and test stimuli to the product by actuating hardware. After each application, an interval is programmed to control the effect of transient conditons. The test results are then sensed, collected, and stored before conditions are changed and the next stimuli is applied. The stored result, or past series of results, can thus be compared to some criteria and the result used to decide further action.
Continuing airworthiness
Published in David Wyatt, Mike Tooley, Aircraft Electrical and Electronic Systems, 2018
Automatic test equipment (ATE) is dedicated ground test equipment that provides a variety of different functional checks on line replaceable units (LRUs) or printed circuit boards (PCBs). The equipment being tested is connected to a variety of external circuits that represent the aircraft interfaces; additional connections are often made for diagnostic purposes. ATE is able to gather and analyse a large amount of data very quickly, thus avoiding the need to make a very large number of manual measurements in order to assess the functional status of an item of equipment.
Avionic Systems
Published in Mike Tooley, Aircraft Digital Electronic and Computer Systems, 2023
Automatic test equipment (ATE) is a dedicated ground test instrument that provides a variety of different tests and functional checks on an LRU or printed circuit card. By making a large number of simultaneous connections with the equipment under test, ATE is able to gather a large amount of data very quickly, thus avoiding the need to make a very large number of manual measurements in order to assess the functional status of an item of equipment.
An area efficient, high-frequency digital built-in self-test for analogue to digital converter
Published in International Journal of Electronics, 2018
M. Senthil Sivakumar, S. P. Joy Vasantha Rani
An analogue to digital converter (ADC) is one of the most frequently used mixed signal circuit system which interconnects analogue and digital circuits into a system. The accuracy of an ADC is a required one in the mixed signal devices because it has a capacity to determine the perfectness of the complete system. Usually, the accuracy of ADC is observed through the comparison of actual and ideal characteristics for static (Linearity, offset, gain) and dynamic (noise, threshold, and distortion) parameters (Milor 1998). In standardised ADC testing, the linearity has considered as a primary parameter since it decides the transfer function and other static and dynamic characteristics of a converter (Maria, Marcelo, Luigi, & Altamiro, 2004; Dai et al. 2014). Automatic Test Equipment (ATE) is a method, popularly used in the standard off-chip testing. Nowadays, the use of ATE has reduced because of long evaluation time and unavailability of the external resources for testing complex mixed signal circuits. On-chip testing is a solution to the complexities persist with the off-chip testing (Mehdi, Bozena, and Karim 1998) like ATE. Fast Fourier Transform (FFT) is a technique used in high precision ADC testing (Pei and Chan 1991; Mishra 2010). Accessing uncertainty and complex multipliers found in FFT occupy an unacceptably large area in the BIST. The static testing methods such as histogram (Kerzerho et al. 2013), spectral analysis (Chauhan, Choi, Onabajo, Jung, & Kim, 2014) are the alternate techniques for reducing area overhead. However, the area overhead of BIST is still a primary concern in an ADC testing. Linearity measurements like differential non-linearity (DNL) and integral non-linearity (INL) require a ramp generator (Khatri and Puradkar 2007; Zhang, Suying, and Zhang 2008; Gamad and Mishra 2009) and digital response analyser (Ruan et al. 2013; Rajath, Pratap, & Bharadwaj, 2014).