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Scan Testing
Published in Vojin G. Oklobdzija, Digital Design and Fabrication, 2017
Boundary-scan was originally developed for digital circuits and systems. The motivations to use BS for analog designs is also true; however, in contrast to digital circuits and systems, analog components are specified by a continuous range of parameters rather than binary values 0 and 1. A new standard is coming called P1149.4. It consists in the development of a mixed signal test bus. The aim is to standardize to several possible tests in the case of analog DUT: interconnect test, parametric test, and internal test. Such tests should be fully compatible with the IEEE 1149.1 standard and helps in measuring the values of discrete components such as pull-up resistors and capacitors. Consequently, P1149.4 can be seen as an extension of IEEE 1149.1 where the BS cells presented above are replaced by analog boundary modules (ABM) at the level of each analog functional pin. Such pins can be accessed via internal analog test bus. Figure 23.8 gives the structure of the P1149.4 bus.
Manufacturing Test
Published in Jack Arabian, Computer Integrated Electronics Manufacturing and Testing, 2020
Standards for Scan testing have been promulgated as: a portion of the IEEE Standard 1149 (“Testability Bus Specification”)IEEE Standard 1149.1 (“IEEE Standard Test Access Port and Boundary-Scan Architecture.”) This standard resulted from the work in Europe and the USA by the Joint Test Action Group (JTAG), which originated in 1985 at Philips in the Netherlands.
System and Embedded Core Testing
Published in Perelroyzen Evgeni, Digital Integrated Circuits, 2018
The joint test action group (JTAG) interface is a totality of facilities and operations permitting the user to test VLSIs without physical access to each of their outputs. The testing according to the IEEE Std 1149.1 standard is called boundary scan testing (BST). Such testing is practicable only for chips with an inside set of special elements, that is, the boundary scan cells (BSCs) and their operation control schemes. Later on, the JTAG interface functions were expanded and used extensively in the configurations of programmable logical devices [1, 2, 7].
Quantum Dot Cellular Automata-Based Scan Flip-Flop and Boundary Scan Register
Published in IETE Journal of Research, 2023
Nehru Kandasamy, Firdous Ahmad, D. Ajitha, Balwinder Raj, Nagarjuna Telagam
The boundary scan cell is mainly used in chip-level testing to test interconnects between integrated circuits on a board. This method performs the testing without using a physical test probe. Boundary scan cell forms boundary scan register on each device. The boundary scan register gives good controllability and observability. It performs four modes of procedure, namely serial, update, capture, and shift modes. In the normal mode, the data input either 0 or 1 is passing through the output as 0 or 1. When performing the update mode, the hold cell content is passing through data out. The data in logic level is captured during the capture mode. The scan out of logic level is shifted to scan in of the next capture cell; the mode is called the shift mode. The schematic and logic design of the proposed Boundary Scan Cell is shown in Figure 14(a) and 14(b), respectively.