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Computer-Aided Analysis
Published in Wai-Kai Chen, Computer Aided Design and Design Automation, 2018
J. Gregory Rollins, Peter Bendix
Next, we need data that represent the behavior of a transistor or set of transistors of different sizes. These data can come from direct measurement or they can be produced by a device simulator such as PISCES.† Typically, one does voltage sweeps on various nodes of the transistor and measures the output current at some or all of these nodes. For example, in an MOS transistor, one might sweep the gate voltage and measure the resulting drain current, holding the drain and bulk voltages fixed. The equipment used to do DC device characterization measurements is usually a DC parametric tester. This equipment usually has a set of SMUs (source/measure units) that can force voltage and measure current, or force current and measure voltage. The measuring equipment can be manually run or controlled by a computer. In either case the measured data must be put onto a hard disk.
Hall Effect Characterization of Nanowires
Published in Klaus D. Sattler, st Century Nanoscience – A Handbook, 2020
Olof Hultin, Kristian Storm, Lars Samuelson
A basic set of test equipment can consist of a source measure unit (SMU) capable of sourcing current in the microampere range through the nanowire and a good digital multimeter capable of measuring the Hall voltage. Care should be taken to ensure that the voltmeter has much higher input impedance than the nanowire device. Alternatively, another SMU can be used to measure the Hall voltage.
Luminescence enhancement of OLED lighting panels using a microlens array film
Published in Journal of Information Display, 2018
Jun-Han Han, Jaehyun Moon, Doo-Hee Cho, Jin-Wook Shin, Hye Yong Chu, Jeong-Ik Lee, Nam Sung Cho, Jonghee Lee
For the case of the 1.5 × 1.5 mm2-unit OLEDs, the EL spectrum was measured using a Minolta CS-1000. The luminescence-current density (L-J) characteristics were measured with a current/voltage source/measure unit (Keithley 238) and a spectroradiometer (Minolta CS-100), respectively. For the case of the larger-luminescence-area OLED panels, the EL spectrum was measured using a spectra colorimeter (Photo Research, PR-650), and the L-J characteristics were measured with a current/voltage source/measure unit (Keithley 2400) and a two-dimensional (2D) luminance colorimeter (Minolta CA-2000), respectively.
Added Noise in Oscillators Caused by the Transistor Base Emitter Breakdown Phenomenon
Published in IETE Journal of Research, 2023
Wolfgang Griebel, Matthias Rudolph, Ulrich L. Rohde
The behavioral current source sits between the base and emitter and implements the breakdown current formula we have measured with a source measure unit (SMU). The exponential dependency ensures that no significant current flows during normal operation within datasheet limits.