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The Automatic Test Pattern Generation (ATPG) Process
Published in Perelroyzen Evgeni, Digital Integrated Circuits, 2018
For many simple circuits, the D algorithm can cope well with the fault-detecting problem that has been set, which is evidenced by the Figure 5.10 circuit. The 1 1 1 test vector reveals the B s@1 faults for the case of absent fanout in the specific circuit node. If the fanout is found, as in Figure 5.11 for instance, then two fault messages, D and D, quench each other, and the constant logical unity is found at the circuit output. The bottleneck is called the reconvergent fanout and is associated with the D algorithm’s attempts to operate via only one path from the circuit’s primary inputs.
Test Pattern Generator for MV-Based QCA Combinational Circuit Targeting MMC Fault Models
Published in IETE Journal of Research, 2022
Here, in this paper, we are proposing the extension of basic test generation algorithm being used for CMOS-based combinational circuits with reference to majority voter-based combinational QCA circuit considering the special characteristics and properties of MV. The highlights of the proposed work are as follows: Unlike AND, OR, NAND, NOR and INV in conventional CMOS test pattern generation algorithm, the test generation algorithm for QCA will have to address MV as a primitive logic gate which was not the case earlier. Furthermore, the QCA circuits will contain MV working as AND (MV_AND) and MV working as OR (MV_OR).The available ATPG [10,11] uses conventional s-a-1 and s-a-0 fault model. We have shown in [9] that this fault model is not sufficient to detect multiple missing cell defects.The existing SCOAP-based testability measures are available for logic primitive like AND, OR, NAND, NOR, INV etc. Such measures for MV are needed to introduce. In the available literature for QCA ATPG [10], the probability-based controllability measures are considered. We have shown that the probability-based approach fails in reconvergent fanout circuit. Therefore, Sandia Controllability Observability Analysis Program (SCOAP) [12] testability measures are extended for MVs in this paper and incorporated in the proposed ATPG.