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Detector Characterization
Published in Alan Owens, Semiconductor Radiation Detectors, 2019
Beamlines are usually tailored for particular experimental disciplines using sub-systems to filter, intensify or otherwise manipulate the light to generate a specific set of characteristics suitable for the needs of the experimental station, which are normally application specific. A typical beamline layout suitable for detector metrology is shown in Fig. 7.24 – the X1 beamline at the Hamburger Synchrotronstrahlungslabor (HASYLAB) radiation facility [54] located at DESY in Hamburg, Germany. This beamline utilizes a double Si crystal monochromator to produce highly monochromatic X-ray beams across the energy range 10–100 keV. Depending on the energy range of interest (and the amount of acceptable harmonic pollution) a choice of Si(111), Si(311) and Si(511) crystal pairs can be selected. Because mechanically, the range of adjustable monochromator angles and crystal separation is finite, the order of the reflection usually sets the useable energy range in a particular system. The range of Si(511) is generally larger than Si(311) which in turn is larger than Si(111). Also the energy resolution tends to be higher for high-order crystals, ranging from 10–4 for Si(111) to 10–5 for Si(511). To cover the entire energy range 10–100 keV, a [511] reflection is usually used, yielding an intrinsic energy resolution of ~1 eV at 10 keV, rising to 20 eV at 100 keV.
Emerging Mirror Technologies
Published in Paul Yoder, Daniel Vukobratovich, Opto-Mechanical Systems Design, 2017
William A. Goodman, Paul R. Yoder
The x-rays produced in the storage ring are directed into one or more beamlines around the storage ring. The beamlines are used to conduct experiments in materials science, magnetism, chemistry, crystallography, and the life sciences and for an ever-increasing and more imaginative list of industrial applications (would you believe, cosmetics?).
Energetic Investigation of Aging Effect on Mechanical Behavior in Wood by Means of XRD Measurement
Published in International Journal of Architectural Heritage, 2022
Koki Imaeda, Mariko Yamasaki, Erina Kojima, Chang-Goo Lee, Takanori Sugimoto, Yasutoshi Sasaki
Synchrotron radiation XRD measurements under tensile load were performed using a thin film X-ray diffractometer (BL8S1 beamline) at the Aichi Synchrotron radiation center. XRD on the transmission mode was adapted to measure the (004) plane of cellulose I of the cellulose microfibrils in the S2 layer (termed as cellulose microfibrils hereafter). Figure 2b shows the relation between the longitudinal direction of specimens and the incident and scattered direction of synchrotron rays. Using the transmission mode, the cellulose (004) plane shown in Figure 2b was measured, corresponding to that of the cellulose microfibrils in the S2 layer of the tracheid’s secondary wall (Lee et al. 2019). The wavelength of the synchrotron radiation was 1.35 Å (emission energy: 9.16 keV), and the measured Bragg angles were 26.5–35°, corresponding to the cellulose (004) plane (cellulose lattice spacing d is approximately 2.59 Å (Tanaka et al. 1980)). Each XRD scan took 330 s. The scattered rays from the specimens were collected in the form of two-dimensional (2D) diffraction patterns, as shown in Figure 3a, and were collected via a semi-conductor detector (PILATUS-100 K, DECTRICS Ltd, Switzerland).