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Power-Aware Testing for Maximum Fault Coverage in Analog and Digital Circuits Simultaneously
Published in IETE Technical Review, 2022
Vivek Kumar Singh, Trupa Sarkar, Sambhu Nath Pradhan
To check the robustness of the proposed method, five analog circuits have been chosen as CUT in the analog portion. These are ITC’97 benchmark circuits [16]. These five CUTs are
Operational amplifierLow-pass filterInverting amplifierComparatorState variable filter