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Spectrometers
Published in Daniel Malacara-Hernández, Brian J. Thompson, Fundamentals and Basic Optical Instruments, 2017
A spectrometer is any device that measures a spectrum. In the example of the advertisements, you, the counter of the ads, would be the spectrometer. In an optical spectrometer, the emission, absorption, or fluorescence spectrum of a material is measured. Spectrometers come in many different forms, and most of them are discussed in this chapter. Their function can be based on any physical phenomenon that varies with optical wavelength or frequency.
Investigation on the impact of physical properties of the coal-ash slurries on the erosion wear performance of WC coated steel by using Image processing technique
Published in International Journal of Coal Preparation and Utilization, 2022
Gurmeet Singh, Satish Kumar, Satbir S. Sehgal, Harjot Singh Gill
In this study, commercially available SS-410 was used as target material for the erosion wear experimentation. Stainless steel (410) is most versatile material which is widely used for the fabrication of slurry equipment’s such as pump impellers, slurry pipelines, pipe bends etc. The substrate material SS-410 was purchased from M/s Steel chain, New Delhi, India. All the samples were fabricated accurately into rectangular shape of 50 × 25 X 5 mm by using Electric Discharge Machining. After that every specimen was centrally drilled with 8 mm hole as shown in Figure 1. The chemical composition of SS-410 was precisely tested by using an optical spectrometer (FM-350, Oxford Instruments, Germany) as listed in Table 1 and the compositional analysis for finding the presence of various elements of SS-410 were carried out by using energy-dispersive spectroscopy (J-6510LV, JOEL, Netherlands) as shown in Figure 2.
Measurement of transient nanoparticle emissions of pulse-jet cleaned filters applying an engine exhaust particle sizer
Published in Aerosol Science and Technology, 2022
Peter Bächler, Jörg Meyer, Achim Dittler
Two different aerosol measurement devices based on different measurement principles were employed in this study. While the aerosol spectrometer detects light scattered at the single particle, the EEPS is based on classification of particles based on their electrical mobility. Several key specifications are compared in Table 1. The high precision laboratory aerosol spectrometer Promo®2000 with welas®2100 sensor can detect particles in a size range from 200 nm to 10 µm. The default settings for the index of refraction was used (n = 1.59 for PSL). Though the employed welas® sensor is a light scattering optical spectrometer (based on the LSAS definition in ISO 21501-11 (2009) contrary to the specification of LSAPC in ISO 21501-44 (2018)) we refer to the device as optical particle counter (or OPC) for simplification in this study, as the two definitions are often used synonymously in literature. The TSI® EEPS 3090 can detect particles ranging from 5.6 to 560 nm. Thus, there is an overlap in the measurement region that enables a comparison of particle counts of the two devices in several size fractions. Another key difference is the maximum concentration of the two devices (Manufacturer specifications: 5 × 105 #/cm³ of Palas® (n.d.) system and 105 − 107 #/cm³ - dependent on the size fraction – for the TSI EEPS). A drawback of the EEPS system is the requirement of a minimum concentration dependent on the corresponding size fractions. Smaller concentrations may be too low to be detected by the electrometer and cannot be distinguished from signal noise.
Gafchromic HD-V2 investigations using MeV ion beams in vacuum
Published in Radiation Effects and Defects in Solids, 2019
L. Torrisi, V. Havranek, M. Cutroneo, A. Torrisi
No traditional scanners and densitometers were used to quantize the darkness of the dosimeter, but it was used a high sensitivity lamp and spectrometer analysis operating in the visible wavelength region. The gafcromic detector was controlled before and after the ion irradiation measuring its optical absorption at 670–700 nm using an AVANTES light source (AvaLight-D(H)-S Deuterium-Halogen Light Sources) coupled by fibers to an optical spectrometer (AvaSpec-ULS4096CL-EVO (CMOS)) used in the range 400 nm – 750 nm wavelengths. Transmission and absorption evaluations were calculated at 700 nm wavelength, where the foils have the maximum sensitivity. The transmission factor T was calculated as a ration between the transmitted intensity with respect to the incident one (T = IT/I0), while the absorbance as the complementary of the transmission factor (A = 1-T), as reported in the experimental set up of Figure 2(b).