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Low-Power Solutions for Wireless Passive Sensor Network Node Processor Architecture
Published in Fei Hu, Qi Hao, Intelligent Sensor Networks, 2012
Vyasa Sai, Ajay Ogirala, Marlin H. Mickle
Building blocks of typical wireless PSN architecture consist of a sensing unit, communication unit, a processing unit, and a power source as shown in Figure 23.1 [4,5]. The sensing unit in most cases consists of a sensor (s) and an analog-to-digital converter (ADC) as components. A sensor is a device generally used to measure some physical quantity such as temperature, light, etc. The ADC is used to convert the received analog data signal into a digital signal so as to be processed by the microcontroller. The processing unit consists of a low-power microcontroller and a storage block. The microcontroller processes data and controls and coordinates other component functionalities. The communication unit consists of an RF transceiver module that transmits and receives data to/from other devices connected to the wireless network. The power unit mainly delivers the RF–DC converted power to the rest of node units and also stores additional power based on availability.
An area efficient, high-frequency digital built-in self-test for analogue to digital converter
Published in International Journal of Electronics, 2018
M. Senthil Sivakumar, S. P. Joy Vasantha Rani
An analogue to digital converter (ADC) is one of the most frequently used mixed signal circuit system which interconnects analogue and digital circuits into a system. The accuracy of an ADC is a required one in the mixed signal devices because it has a capacity to determine the perfectness of the complete system. Usually, the accuracy of ADC is observed through the comparison of actual and ideal characteristics for static (Linearity, offset, gain) and dynamic (noise, threshold, and distortion) parameters (Milor 1998). In standardised ADC testing, the linearity has considered as a primary parameter since it decides the transfer function and other static and dynamic characteristics of a converter (Maria, Marcelo, Luigi, & Altamiro, 2004; Dai et al. 2014). Automatic Test Equipment (ATE) is a method, popularly used in the standard off-chip testing. Nowadays, the use of ATE has reduced because of long evaluation time and unavailability of the external resources for testing complex mixed signal circuits. On-chip testing is a solution to the complexities persist with the off-chip testing (Mehdi, Bozena, and Karim 1998) like ATE. Fast Fourier Transform (FFT) is a technique used in high precision ADC testing (Pei and Chan 1991; Mishra 2010). Accessing uncertainty and complex multipliers found in FFT occupy an unacceptably large area in the BIST. The static testing methods such as histogram (Kerzerho et al. 2013), spectral analysis (Chauhan, Choi, Onabajo, Jung, & Kim, 2014) are the alternate techniques for reducing area overhead. However, the area overhead of BIST is still a primary concern in an ADC testing. Linearity measurements like differential non-linearity (DNL) and integral non-linearity (INL) require a ramp generator (Khatri and Puradkar 2007; Zhang, Suying, and Zhang 2008; Gamad and Mishra 2009) and digital response analyser (Ruan et al. 2013; Rajath, Pratap, & Bharadwaj, 2014).