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Application of AFM for Analyzing the Microstructure of Ferroelectric Polymer as an Energy Material
Published in Cai Shen, Atomic Force Microscopy for Energy Research, 2022
The microstructure of polymer can be analyzed by various techniques, including X-ray scattering like small-angle X-ray scattering (SAXS) and wide-angle X-ray scattering (WAXS), X-ray diffraction (XRD) with out-of-plane and in-plane geometry (GIXD) and vibrational spectroscopy like IR and Raman. Microstructural information may also be derived by analyzing the electrical properties. Compared to these, high-resolution microscopy is a straightforward method and has the advantage of direct morphology and lattice structure imaging. However, the problem for conventional electron microscopy (SEM, TEM) is that the polymer sample may be destroyed during measurement. In contrast, SPM-based microscopy has the advantages of high-resolution imaging without destroying the samples. In this category, AFM and the variant are particularly useful. Based on the selection of the specific polymeric systems, PFM can be used to get a broad range of information about structural characteristics and electrical properties, which may lead to a better understanding of the growth process. More recently appeared AFM-IR can give chemical imaging such as dipole and phase content distribution mapping. Thus, these techniques are highly desirable for further analyzing the detailed mechanisms of phase change in ferroelectric polymer. As aforementioned, because the microstructure and phase content are key factors for the functionality and performance of the relevant devices, these AFM-based techniques have been demonstrated to be rather ideal tools for the fluoropolymer for energy applications.20
Research Methods of Nanostructures and Nanomaterials
Published in Zulkhair A. Mansurov, Carbon Nanomaterials in Biomedicine and the Environment, 2020
Zulkhair A. Mansurov, Nina. N. Mofa, Tatyana A. Shabanova
Scanning Probe Microscope (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Binnig and Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe [13]. SPM in the recent two decades, scanning probe microscope (SPM) has served as a universal method of investigation on monosize objects. In the microscope, there is a needle-probe which scans the surface with the resolution of a fraction of angstrom (1 Å+0.1 nm). As a result of subsequent testing of the surface from point to point, an image is build line-by-line on the monitor. Unlike other beam methods of probing and scanning (in particular, electron or X-ray beams), in SPM only solid probes are used. The principle of their work is as follows: application of high negative voltage to the edge of the needle leads to auto electronic emission. The emitted electrons get accelerated in the electric field and bombard the oppositely located screen. Hence, in 1936, E. Miller for the first time got an image of the probe edge by a lens-free method. By the changing of polarity on the needle, a field-emission microscope was transformed into a field on microscope with the help of which in 1951 E. Miller achieved atomic resolution in the surface microscopy.
Introduction to Atomic Force Microscopy
Published in Wesley C. Sanders, Atomic Force Microscopy, 2019
Scanning probe microscopes (SPMs) are a class of microscopes that capture surface topography using probes that scan sample surfaces [1]. SPM is one of the most common tools in surface science [2]. SPMs are now available in several research labs throughout the world and are widely regarded as the technique that ushered in the study of matter at the nanoscale [3]. SPMs do not use glass or magnetic lenses for producing images [4]. Image acquisition involves scanning across sample surfaces with a sharp probe that monitors tip-sample interactions to generate images [5]. The two primary forms of SPM are the scanning tunneling microscope (STM) and the atomic force microscope (AFM) [1]. These techniques allow extreme magnifications in the x-, y-, and z-directions, which facilitate atomic scale imaging with high resolution. These instruments can be used in any environment, such as ambient air, various gases, liquids, vacuum, low temperatures, and high temperatures. Imaging in liquid allows the study of live biological samples and eliminates the capillary forces that are present at the tip-sample interface when imaging samples in ambient air [6]. SPM origins involve the invention of the STM in 1981 at IBM (Zurich) by Heinrich Rohrer and Gerd Binning. STMs use an electrical tunneling current between a metal tip and sample to record sample topography (Figure 1.1). Although the ability of the STM to image surfaces with atomic resolution caused a great impact on the technology community, STM imaging is limited to conductive materials [1].
Mechanical testing of two-dimensional materials: a brief review
Published in International Journal of Smart and Nano Materials, 2020
Karrar K. Al-Quraishi, Qing He, Wesley Kauppila, Min Wang, Yingchao Yang
AFM belongs to the family of scanning probe microscopy (SPM), having the resolution on the order of a fraction of a nanometer. The surface information of a sample is collected by a mechanical probe through ‘feeling’ or ‘touching.’ Tiny but accurate and precise movement of the probe is controlled by the piezoelectric elements installed in the AFM. The AFM is also capable of positioning single atoms at ambient conditions, giving the potential to build future nanoscale devices. Figure 2 demonstrates a sketch of laser alignment from the laser diode to probe cantilever and then to the split photodiode detector.
Applications of atomic force microscopy in materials, semiconductors, polymers, and medicine: A minireview
Published in Instrumentation Science & Technology, 2020
SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Their magnifications can reach 300 million times, and the smallest resolution is as high as 0.01 nm. In addition, they can detect a variety of physical and chemical properties, manipulate micro-nano materials, and prepare novel functional devices with physical and chemical characteristics.[3,4]
Study of silver electrodeposition in deep eutectic solvents using atomic force microscopy
Published in Transactions of the IMF, 2018
A. P. Abbott, M. Azam, K. S. Ryder, S. Saleem
Scanning probe microscopy (SPM) enables measurements to be performed with higher resolution than optical spectroscopy.10,11 Initially ex-situ AFM and SEM studies were used for the investigation of the spatial and size distribution and the morphology of the deposit and gave a reliable atomistic description of nucleation and growth for precise control of metal on metal homoepitaxy and heteroepitaxy.12,13