China
Africa
Explore chapters and articles related to this topic
Electropolishing in Practice
Published in Madhav Datta, Electrodissolution Processes, 2020
While visual observations allow one to get an aesthetic sense of an electropolished part such as shine and reflectivity, more involved examination of surfaces is required to quantify the surface roughness, surface features, and chemical nature of the surface. Electropolished surfaces are measured by either contact or noncontact methods. Contact methods use a profilometer in which a stylus is dragged across the surface. Noncontact methods include optical microscopy, electron microscopy, atomic force microscopy, interferometry, confocal microscopy, and electrical capacitance measurements.
Study of Properties of Nanostructures and Metal Nanocomposites on Their Basis
Published in Satya Bir Singh, Alexander V. Vakhrushev, A. K. Haghi, Nanomechanics and Micromechanics, 2020
A. Yu. Fedotov, Alexander V. Vakhrushev
The imposition of two light waves leads to the appearance of light and dark interference fringes on the sample. By means of strips, the structure of the sample surface is analyzed. Scanning of the entire sample area is achieved by vertical movement of the lens by a piezoelectric motor. The resulting light pattern is processed in the camera and converted into a digital image consisting of dots of different brightness. Vertical measurements are performed according to interference data. Measurements in the plane of the scan sample are based on the field of view and resolution of the lens used. The results of the surface profile of the sample are displayed on the display in the form of images, graphs, and numerical data. The profilometer has a vertical resolution of up to 0.1 nm, the horizontal one varies in the range of 0.43–11.6 μm and depends on the selected lens.
Characterization of Surfaces
Published in Kenneth C. Ludema, Oyelayo O. Ajayi, Friction, Wear, Lubrication, 2018
Kenneth C. Ludema, Oyelayo O. Ajayi
Unlike the stylus system, optical profilometer are non-contact methods and are based on white light or laser interferometry principles, either phase-shift or vertical scanning. The vertical resolution of these systems are order of nanometer to fractions of nanometer range. Optical profilometers with a large menu of capabilities included in their software are available from many companies.
Predictive modelling of surface roughness in fused deposition modelling using data fusion
Published in International Journal of Production Research, 2019
Dazhong Wu, Yupeng Wei, Janis Terpenny
A contact profilometer is used to measure surface roughness. A profilometer measures small surface variations in vertical stylus displacement as a function of position. A few roughness parameters, including maximum profile peak height, average maximum profile peak height, and maximum roughness depth, can be used to quantify roughness. In this study, roughness average (Ra) was used to quantify roughness. Ra is the arithmetical average of the absolute values of the profile heights over the evaluation length. As shown in Figure 3(a), a test part, an engine intake flange, serves as the case study. Figure 3(b) shows the engine intake flange printed by the FDM process. Figure 3(c) shows how the surface roughness of the 3D printed test part was measured. As shown in Figure 4, the engine intake flange consists of support, bottom, middle, and top structures with different cross sections.
Development of aggregate micro-texture during polishing and correlation with skid resistance
Published in International Journal of Pavement Engineering, 2020
Dawei Wang, Zeyu Zhang, Jonas Kollmann, Markus Oeser
A high-resolution profilometer manufactured by Fries Research & Technology GmbH (see Figure 6) was utilised in this study to collect the height profile information from the aggregate specimens before and after APM polishing for evaluating the changes in their surface. The profilometer has a vertical scanning range of 50 mm and a measurement area of 200 mm × 200 mm with the highest vertical measurement accuracy of 6 nm and a lateral resolution of 3.3 µm.