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Analytical Chemistry
Published in W. M. Haynes, David R. Lide, Thomas J. Bruno, CRC Handbook of Chemistry and Physics, 2016
W. M. Haynes, David R. Lide, Thomas J. Bruno
MWD: microwave (assisted) digestion NAA: neutron activation analysis NCIMS: negative chemical ionization mass spectrometry NDP: neutron depth profiling NEXAFS: near edge x-ray absorption fine structure NHE: normal-hydrogen electrode NICI: negative ion chemical ionization NIR: near-infrared, near-IR NIRA: near-infrared reflectance analysis nm: nanometer NMR: nuclear magnetic resonance NOE (nOe): nuclear Overhauser effect NOESY: nuclear Overhauser effect spectroscopy NPD: nitrogen-phosphorus detector, normal photoelectron diffraction NPLC: normal phase liquid chromatography ODMR: optically detected magnetic resonance ODS: octadecylsilane OES: optical emission spectrometry, optical emission spectroscopy OID: optoelectronic imaging device OMA: optical multichannel analyzer OPO: optical parametric oscillator OPTLC: over-pressured thin-layer chromatography ORD: optical rotary dispersion OTE: optically transparent electrodes PA: proton affinity PAA: photon activation analysis PAGE: polyacrylamide gel electrophoresis PAH: polycyclic aromatic hydrocarbon PAS: photoacoustic spectroscopy PB: particle beam PC: paper chromatography PCA: principal component analysis PCR: polymerase chain reaction PCS: photon correlation spectroscopy PCSE: partially coherent solvent evaporation PD: plasma desorption PDA: photodiode array PDHID: pulsed discharge helium ionization detector PDMS: plasma desorption mass spectrometry, polydimethyl siloxane PED: pulsed electrochemical detection, plasma emission detector, photoelectron diffraction PES: photoelectron spectroscopy PET: positron emission tomography PFIA: process flow injection analysis PGC: packed-column gas chromatography pH: negative logarithm of hydrogen ion concentration PICI: positive ion chemical ionization PID: photoionization detector PIXE: particle-induced x-ray emission pK: negative logarithm of an equilibrium constant PLE: pressurized liquid extraction PLOT: porous-layer open tubular PMT: photomultiplier tube ppb: parts per billion ppm: parts per million ppt: parts per thousand, parts per trillion PSD: position sensitive detector PTFE: polytetrafluoroethylene PTR: proton transfer reaction (in mass spectrometry) PTV: programmable temperature vaporizer
Neutron Depth Profiling Study on 6Lithium and 10Boron Contents of Nuclear Graphite
Published in Journal of Nuclear Science and Technology, 2021
Shasha Lv, Jie Gao, Yuanyuan Liu, Yumeng Zhao, Jianping Cheng, Zhengcao Li
Neutron depth profiling (NDP) is a non-destructive testing method, which can accurately obtain the distribution of light elements along the depth of materials [32]. The application of NDP to measure isotope contents and element distributions is a model of interdisciplinary research, we used in-situ neutron depth profiling on monitoring the lithium spatial distribution of lithium metal anodes [33]. The depth distribution analysis of 3He, 10B, and 6Li isotopes has played an important role in alloy and semiconductor materials [34], which is important for reliability evaluation of advanced functional devices and fission or fusion reactor materials. Firstly, Ziegler et al. [35] pointed out that NDP can be used for nondestructive quantitative and depth distribution analysis of light elements near the surface of any condensed matter. Later, Downing et al. [36] used NDP extensively to measure the concentration profiles of other neutron-sensitive light isotopes.
A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam
Published in Radiation Effects and Defects in Solids, 2020
E. Vezhlev, A. Ioffe, S. Mattauch, S. Staringer, V. Ossovyi, Ch. Felder, E. Hüger, J. Vacik, I. Tomandl, V. Hnatowicz, C. Chen, P.H.L. Notten, Th. Brückel
Neutron depth profiling is a non-destructive analytical tool to study near-surface distributions of some light isotopes with high neutron capture cross-sections ( and few more) in solid materials. The neutron-absorption results in nuclei decay with the emission of a charged particle (α-particle, proton or triton) and a recoiling nucleus with well-known initial energies . These particles are emitted isotropically and before escaping a sample surface, each particle looses a certain amount of energy mainly because of the interactions with the atomic electrons of the host material. The amount of energy losses defines the depth x at which the particle was created: where represents the stopping power of the host material for a charged particle. A raw spectrum already depicts the concentration profile of the analyzed element. The spectrum can be unfolded taking the instrument resolution function and possible uncertainties into account (1). By using measurements with a calibrated sample, the concentration depth profile can be derived in absolute units.