Explore chapters and articles related to this topic
Whereabouts of missing atoms in a laser-injected Si (Part III)
Published in Philosophical Magazine, 2023
Hiroyasu Saka, Hiroyuki Iwata, Makoto Takagi
In this study TEM specimens were prepared using a focused ion beam (FIB) technique. Here, Ga ions are used to sputter away, making the sample under consideration electron-transparent. To protect against surface damage by Ga ions, the surface of the whole sample is first coated with tungsten hexacarbonyl W(CO)6. Then, the surface of the area to be observed is irradiated with Ga ions to decompose W(CO)6, leading to the formation of a protective film of pure W. In these processes of site specification, the sample is likely heated to some extent.