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Auger Electron Spectroscopy
Published in Arthur T. Hubbard, The Handbook of Surface Imaging and Visualization, 2022
Auger electron spectroscopy (AES) is the surface analysis technique that combines both high spatial resolution and elemental detection to the best degree of the currently available procedures. Commercial instrumentation is capable of spatial resolution down to 20 nm, and AES can identify all of the elements except hydrogen and helium. Chemical information can be obtained in certain instances. Other techniques often will have better spatial resolution, better surface sensitivity (about 1 % in the detection volume), or slightly better surface specifity than AES. The aim of this chapter is to provide basic information about AES. Other special topics related to AES, such as angular-resolved AES, scanning Auger microscopy (SAM), and X-ray excited AES, will be discussed in other chapters in this volume.
Preparation of Thin Oxide Films: Concepts and Toolkits
Published in Shamil Shaikhutdinov, Introduction to Ultrathin Silica Films Silicatene and Others, 2022
Both methods are based on ionization of core levels under high-energy irradiation. In case of XPS, a sample is illuminated with soft x-rays (100–1500 eV), whereas for AES the sample is exposed to high-energy electrons (typically, 3 keV). Experimentally measured is the kinetic energy of electrons emitted from the surface which is element specific. Both methods provide a total elemental analysis, except of hydrogen and helium.
Introduction to Nanosensors
Published in Vinod Kumar Khanna, Nanosensors, 2021
What are the uses and limitations of the Auger electron spectroscopy (AES) method? AES is a popular technique for determining the composition of the top few layers of a surface. It is unable to detect hydrogen or helium, but is sensitive to all other elements. It is most sensitive to the low atomic number elements.
Effects of Ionic Liquid Additive Concentration on Scuffing and Wear in Oil-Starved EHL Contacts
Published in Tribology Transactions, 2018
Nikhil Murthy, Stephen Berkebile, Amarendra K. Rai, Eric Hille, Jeffrey Ewin
Using AES, the phosphorous-rich film on the surfaces of the reciprocating contact test tracks appears to have high concentrations of iron mixed with moderate concentrations of phosphorous. AES can obtain compositional information at just the top few nanometers of the surface. In Fig. 8b it can be seen that there is a concentration of 10 at% decreasing to 5 at% phosphorus that exists alongside iron concentrations of 30 to 60 at% for at least the top 80 nm. The film was observed to have high concentrations of iron and mild concentrations of phosphorous within these test tracks. This is an observation similar to that made within the Stribeck curve test tracks using EDS but differs from the EDS measurements outside the test track where high concentrations of phosphorous and low concentrations of iron were observed. It should be noted that nickel, which is an additive in AISI 9310 steel, is present in small concentration of approximately 5 at% on the track without IL but at much lower concentrations of approximately 1 to 2 at% for the track with IL.