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Study of Polar Region Atmospheric Electric Field Impact on Human Beings and the Potential Solution by IPMC
Published in Srijan Bhattacharya, Ionic Polymer–Metal Composites, 2022
Suman Das, Srijan Bhattacharya, Subrata Chattopadhyay
Electrostatic discharge (ESD) events are related to static electricity that creates some hazardous effects in view of human health as well as damage to sophisticated electronic systems. ESD phenomena are assumed to be the result of human activities. The atmospheric electricity which is due to natural phenomena is much analogous to static electricity processes. If there is a thundercloud overhead, the field is usually reversed and runs easily into the tens of kV/m. If a horizontal metal plate exposed to the free atmosphere is connected to ground through a sensitive ammeter, it would measure a current of about 3 × 10−12 A/m2. A value of 3 pA/m2 is not much, but when it is taken for the earth as a whole, the current amounts to about 1500 A [63]. According to the study reported by Charry [64], positive ions have much adverse effects on human physiological aspects in comparison with negative ions. This trend suggests that air ion exposure has an effect on humans and animals. Electrostatic discharges (ESDs) produced in the human tissue due to biophysical interactions with the environment are evaluated by comparing the fields.
Reliability Considerations
Published in Steve Moore, Designing with Analog Switches, 2020
ESD stands for “Electrostatic Discharge”. Static electricity can cause significant damage to semiconductor devices, especially MOSFETs that are used in analog switches. While the current levels encountered in ESD are generally very low, the voltages generated can be very high. For example, on a dry winter day (20% relative humidity or less), simply walking across a carpet can generate 35,000 V of static electricity. This voltage is sufficient in many cases to destroy the gate oxide of an unprotected MOSFET. It is also sufficient to destroy metalization patterns that are sufficiently thin in any IC, including bipolars. Because of this, much attention has been focused on schemes for protection, resulting in various ESD ratings, and standards for testing ESDS (ESD sensitivity) have been developed. Also, standard procedures for handling static sensitive ICs have been developed to reduce the chance of ESD damage.
Design of Power-Rail ESD Clamp Circuits with Gate-Leakage Consideration in Nanoscale CMOS Technology
Published in Juin J. Liou, Krzysztof Iniewski, Electrostatic Discharge Protection, 2017
Electrostatic discharge (ESD) phenomenon is a charge flow when two objects with different voltage potentials reach contact. Such ESD events can cause serious damage to the integrated circuit (IC) products, during assembly, testing, and manufacturing. To protect the IC products with the required ESD specifications, typically such as 2 kV in human body model (HBM) [1] and 200 V in machine model (MM) [2], the whole-chip ESD protection scheme formed with the power-rail ESD clamp circuit had been often used in the modern IC products [3]. As shown in Figure 5.1, the power-rail ESD clamp circuit is a vital element for ESD protection under different ESD stress modes. The ESD stress modes include Vdd-to-Vss (or Vss-to-Vdd) ESD stress between the rails, as well as the positive-to-Vss (PS) mode, negative-to-Vss (NS) mode, positive-to-Vdd (PD) mode, and negative-to-Vdd (ND) mode, from input/output (I/O) to Vdd/Vss. Therefore, the power-rail ESD clamp circuit must provide low-impedance discharging path under ESD events but keep in off-state with standby leakage current as low as possible under normal circuit operation conditions.
The ESD Control Program Handbook
Published in Technometrics, 2022
In electronics manufacturing, electrostatic discharge (ESD), which can damage or destroy modern electronic components, has become a concern. The preface of The ESD Control Program Handbook states “few books have been available to discuss, evaluate, maintain, and update an effective ESD control program.” Due to this concern, 13 chapters in this book aim to cover all the aspect of modern process for electrostatic control in the manufacturing or other materials related to electronics.
Calibration of Electrostatic Discharge (ESD) Generator in Accordance with IEC61000-4-2: 2008 at SCL
Published in NCSLI Measure, 2018
H. W. Lai, Michael W. K. Chow, K. Y. Chan
All electrical and electronic equipment are subject to electrostatic discharge under an electromagnetic environment. Electrostatic charge, which builds up on a human being, can be coupled to these devices by direct human contact or indirect contact via metallic objects. Electrostatic discharge (ESD) is a tiny version of lightning which can damage electronic circuitries. An ESD generator, also known as an ESD gun or ESD simulator, is often used to test the immunity of devices to ESD under certain DC high voltage pulses, typically 8 kV. To improve the reproducibility of the measured results and to have valid traceability, periodic calibration of ESD generators are necessary. The requirements for calibrating an electrostatic discharge (ESD) generator are given in Annex B.4 of the International Standard IEC 61000-4-2 Edition 2.0 (2008–12) of electromagnetic compatibility [1] and in the literature [2]. The properties to be tested for the waveform of current discharge pulses and DC high voltage pulses under contact discharge mode are specified in the International Standard. By following the recommendations in IEC 61000-4-2, the Standards and Calibration Laboratory (SCL) has developed a series of technical procedures to test the required parameters. The measured data includes the first peak current, the rise time, and the current at 30 ns and 60 ns of the output current discharge waveform for contact discharge test. The waveform is obtained by an ESD target-attenuator-cable, which is a current to voltage transducer. Tests are usually conducted at both positive and negative output pulse voltages at 2 kV, 4 kV, 6 kV, and 8 kV. The open circuit DC voltage of the ESD generator before discharge for both contact and air discharge modes are also measured using electrostatic voltmeter. For the air discharge mode, the measured voltage is up to ±15 kV. The calibration is traceable to various reference standards maintained at SCL, including DC voltage, DC resistance, RF power, attenuation, and frequency standards. In this article, an ESD generator in the SCL (the unit under test, or UUT) is calibrated using the procedures described in this paper as a demonstration. The measurement results together with the corresponding uncertainties are presented. Section 2 provides general information for the calibration. The current discharge pulse test and the DC high voltage test are described in Sections 3 and 4, respectively. The preparation of instrument, the measurement setup, the measurement procedure, and the uncertainty evaluation are discussed in detail in both sections. Finally, a conclusion is provided.