Industrial Applications
Vlado Valković in Low Energy Particle Accelerator-Based Technologies and Their Applications, 2022
Conventional focused ion beam systems employ a liquid-metal ion source (LMIS) to generate high-brightness beams such as Ga+ beams. Recently there has been an increased need for focused ion beams in areas like biological studies, advanced magnetic-film manufacturing and secondary-ion mass spectroscopy (SIMS). Ji et al. (2005) reviewed the status of development on focused ion beam systems with ion species such as O2+, P+and B+. Compact columns for forming focused ion beams from low energy (~3 keV), to intermediate energy (~35 keV) were discussed. By using focused ion beams, a SOl MOSFET was fabricated entirely without any masks (Fig. 4.14).
Design and Manufacturing of CNT-Based Nanodevices for Optical Sensing Applications
Iniewski Krzysztof in Integrated Microsystems, 2017
Another controllable assembly process for fabricating CNT devices is to mechanically manipulate CNTs to bridge the microelectrodes. Atomic force microscope (AFM), or scanning force microscope, was invented in 1986 by Binnig et al. [47]. Figure 18.1 shows the schematic diagram of a head scanning AFM system. Like all other scanning probe microscopes, the AFM utilizes a sharp probe moving over the surface of a sample in a raster scan. In the case of the AFM, the probe is a tip at the end of a cantilever which bends in response to the force between the tip and the sample. The surface topography is acquired by recording the bending of the cantilever at each sampling point. A single CNT attached at the tip end of an AFM cantilever were manipulated using focused ion beam [48]. But the nanotube has to be metal coated for manipulation. Hence this technology is not good for building nanoelectronic devices. A 3D manipulation of CNTs has been studied in [49], but the manipulation has to be performed under scanning electron microscopy, which limited the applications. A more general way is to manipulate CNTs using the AFM tip such that CNTs can be positioned on the substrate surface in a bare environment [50–52], but all these works limited to manipulating CNTs and none of them built nanoelectronic devices through manipulating CNTs. In short, no single process can manufacture CNT-based nanodevices nowadays. In order to overcome the difficulties to fabricate nanodevices, we have developed a hybrid manufacturing process for building CNT-based nanodevices using a DEP deposition system and AFM manipulation, the DEP deposition system can approximately deposit CNTs to metal electrodes, followed by fine manipulation by an AFM nanorobotic system. As a result, CNT-based nanodevices can be made effectively.
Diagnostic Electron Microscopy of Retina
Published in Seminars in Ophthalmology, 2018
Rishikesh Kumar Gupta, Inderjeet Kaur, Tapas C. Nag, Jay Chhablani
To create a coherent beam of electrons, the magnetic lenses (made up of the coil and soft iron) are placed-in along the path of the accelerated electrons. When the current passes through these coils, it creates an electromagnetic field. The strength of the electromagnetic field and power of magnetic lenses regulates the coherence property of the electron beams by altering the current flowing through the coil.28 A very high vacuum (approximately ranging from 10–5 to 10–8 Pascal) is maintained around the electron source and specimen, to reduce the probability of striking of the electrons to the gaseous molecule is up to almost zero while traversing through the column. Finally, this focused ion beam of electrons interacts with the specimen in a very high vacuum chamber.
Bridging the gap between fundamental research and product development of long acting injectable PLGA microspheres
Published in Expert Opinion on Drug Delivery, 2022
Xun Li, Zhanpeng Zhang, Alan Harris, Lin Yang
Compared to conventional scanning electron microscopy (SEM) imaging, FIB-SEM 3D imaging experiment adds a ‘milling’ tool in the form of a focused ion beam (FIB). Due to its heavy ionic mass, the Gallium FIB removes a small amount of material, thus exposing the surface and microstructures underneath. Repetitive FIB milling followed by SEM imaging produces a stack of images which can be reconstructed into a 3D volume. Therefore, by FIB-SEM, the internal structure of PLGA microspheres could be observed and characterized as Figure 5d shows. Then, the correlation between drug distribution, porosity, and internal microstructure of PLGA microspheres could be established. And more importantly, during the in vitro release period, the drug dissolution and distribution, surface morphology, internal structure changes and even interaction between polymer and drug could be monitored and reflected by FIB-SEM [123,124]. DigiM is imaged-based platform which could provide FIB-SEM g services go beyond just the images, with AI analysis to quantify the internal microstructures. Combined with artificial-intelligence Image analytics, it might become a game changer in the area of micro/nano size area.
In vitro effects of cobalt and chromium nanoparticles on human platelet function
Published in Nanotoxicology, 2021
Dominik Taterra, Bendik Skinningsrud, Przemysław A. Pękala, Iwona M. Tomaszewska, Krzysztof Marycz, Marek W. Radomski, Krzysztof A. Tomaszewski
The NPs for this study were purchased from US Research Nanomaterials Inc. (Houston, TX). The following NPs were chosen for this study: Co 28 nm (US1080); CoO 50 nm (US3051); Co2O3 50 nm (US3053); Co3O4 30–50nm (US3055); Cr 35–45nm (US1086); Cr2O3 60 nm (US3060). Each of the NPs was dispersed in water and platelet-poor plasma (PPP) at a concentration of 1 µg/mL in each of the respective dispersants. This was achieved by diluting a known concentration and volume of aqueous dispersed NPs to the desired concentration. The size and zeta-potential for all NPs tested were determined using a Zetasizer® Nano ZS (Malvern Instruments Ltd, UK) at 25 °C using a DTS 1060 C clear disposable zeta cell (Malvern Instruments). The size and shape of the tested NPs were confirmed using an FEI QUANTA 3D 200i scanning electron microscope with a focused ion beam-column.
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